Add smart input plugin for collecting S.M.A.R.T. data (#2449)
This commit is contained in:
Rickard von Essen
committed by
Daniel Nelson
Daniel Nelson
parent
002ccf3295
commit
e69c3f9d1c
426
plugins/inputs/smart/smart_test.go
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426
plugins/inputs/smart/smart_test.go
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@@ -0,0 +1,426 @@
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package smart
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import (
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"fmt"
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"os"
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"os/exec"
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"testing"
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"github.com/influxdata/telegraf/testutil"
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"github.com/stretchr/testify/assert"
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"github.com/stretchr/testify/require"
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)
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var (
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mockScanData = `/dev/ada0 -d atacam # /dev/ada0, ATA device
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`
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mockInfoAttributeData = `smartctl 6.5 2016-05-07 r4318 [Darwin 16.4.0 x86_64] (local build)
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Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
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CHECK POWER MODE not implemented, ignoring -n option
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=== START OF INFORMATION SECTION ===
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Model Family: Apple SD/SM/TS...E/F SSDs
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Device Model: APPLE SSD SM256E
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Serial Number: S0X5NZBC422720
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LU WWN Device Id: 5 002538 043584d30
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Firmware Version: CXM09A1Q
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User Capacity: 251,000,193,024 bytes [251 GB]
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Sector Sizes: 512 bytes logical, 4096 bytes physical
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Rotation Rate: Solid State Device
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Device is: In smartctl database [for details use: -P show]
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ATA Version is: ATA8-ACS T13/1699-D revision 4c
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SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
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Local Time is: Thu Feb 9 16:48:45 2017 CET
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SMART support is: Available - device has SMART capability.
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SMART support is: Enabled
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=== START OF READ SMART DATA SECTION ===
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SMART overall-health self-assessment test result: PASSED
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=== START OF READ SMART DATA SECTION ===
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SMART Attributes Data Structure revision number: 1
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Vendor Specific SMART Attributes with Thresholds:
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ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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1 Raw_Read_Error_Rate -O-RC- 200 200 000 - 0
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5 Reallocated_Sector_Ct PO--CK 100 100 000 - 0
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9 Power_On_Hours -O--CK 099 099 000 - 2988
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12 Power_Cycle_Count -O--CK 085 085 000 - 14879
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169 Unknown_Attribute PO--C- 253 253 010 - 2044932921600
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173 Wear_Leveling_Count -O--CK 185 185 100 - 957808640337
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190 Airflow_Temperature_Cel -O---K 055 040 045 Past 45 (Min/Max 43/57 #2689)
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192 Power-Off_Retract_Count -O--C- 097 097 000 - 14716
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194 Temperature_Celsius -O---K 066 021 000 - 34 (Min/Max 14/79)
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197 Current_Pending_Sector -O---K 100 100 000 - 0
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199 UDMA_CRC_Error_Count -O-RC- 200 200 000 - 0
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240 Head_Flying_Hours ------ 100 253 000 - 6585h+55m+23.234s
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||||||_ K auto-keep
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|||||__ C event count
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||||___ R error rate
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|||____ S speed/performance
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||_____ O updated online
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|______ P prefailure warning
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`
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)
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func TestGatherAttributes(t *testing.T) {
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s := &Smart{
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Path: "smartctl",
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Attributes: true,
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}
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// overwriting exec commands with mock commands
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execCommand = fakeExecCommand
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var acc testutil.Accumulator
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err := s.Gather(&acc)
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require.NoError(t, err)
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assert.Equal(t, 65, acc.NFields(), "Wrong number of fields gathered")
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var testsAda0Attributes = []struct {
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fields map[string]interface{}
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tags map[string]string
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}{
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{
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map[string]interface{}{
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"value": int64(200),
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"worst": int64(200),
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"threshold": int64(0),
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"raw_value": int64(0),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "1",
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"name": "Raw_Read_Error_Rate",
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"flags": "-O-RC-",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(100),
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"worst": int64(100),
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"threshold": int64(0),
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"raw_value": int64(0),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "5",
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"name": "Reallocated_Sector_Ct",
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"flags": "PO--CK",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(99),
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"worst": int64(99),
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"threshold": int64(0),
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"raw_value": int64(2988),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "9",
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"name": "Power_On_Hours",
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"flags": "-O--CK",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(85),
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"worst": int64(85),
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"threshold": int64(0),
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"raw_value": int64(14879),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "12",
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"name": "Power_Cycle_Count",
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"flags": "-O--CK",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(253),
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"worst": int64(253),
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"threshold": int64(10),
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"raw_value": int64(2044932921600),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "169",
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"name": "Unknown_Attribute",
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"flags": "PO--C-",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(185),
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"worst": int64(185),
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"threshold": int64(100),
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"raw_value": int64(957808640337),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "173",
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"name": "Wear_Leveling_Count",
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"flags": "-O--CK",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(55),
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"worst": int64(40),
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"threshold": int64(45),
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"raw_value": int64(45),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "190",
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"name": "Airflow_Temperature_Cel",
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"flags": "-O---K",
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"fail": "Past",
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},
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},
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{
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map[string]interface{}{
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"value": int64(97),
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"worst": int64(97),
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"threshold": int64(0),
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"raw_value": int64(14716),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "192",
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"name": "Power-Off_Retract_Count",
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"flags": "-O--C-",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(66),
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"worst": int64(21),
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"threshold": int64(0),
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"raw_value": int64(34),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "194",
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"name": "Temperature_Celsius",
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"flags": "-O---K",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(100),
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"worst": int64(100),
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"threshold": int64(0),
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"raw_value": int64(0),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "197",
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"name": "Current_Pending_Sector",
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"flags": "-O---K",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(200),
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"worst": int64(200),
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"threshold": int64(0),
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"raw_value": int64(0),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "199",
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"name": "UDMA_CRC_Error_Count",
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"flags": "-O-RC-",
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"fail": "-",
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},
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},
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{
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map[string]interface{}{
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"value": int64(100),
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"worst": int64(253),
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"threshold": int64(0),
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"raw_value": int64(23709323),
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"exit_status": int(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"id": "240",
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"name": "Head_Flying_Hours",
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"flags": "------",
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"fail": "-",
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},
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},
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}
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for _, test := range testsAda0Attributes {
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acc.AssertContainsTaggedFields(t, "smart_attribute", test.fields, test.tags)
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}
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// tags = map[string]string{}
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var testsAda0Device = []struct {
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fields map[string]interface{}
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tags map[string]string
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}{
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{
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map[string]interface{}{
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"exit_status": int(0),
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"health_ok": bool(true),
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"read_error_rate": int64(0),
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"temp_c": int64(34),
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"udma_crc_errors": int64(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"model": "APPLE SSD SM256E",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"enabled": "Enabled",
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"capacity": "251000193024",
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},
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},
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}
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for _, test := range testsAda0Device {
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acc.AssertContainsTaggedFields(t, "smart_device", test.fields, test.tags)
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}
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}
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func TestGatherNoAttributes(t *testing.T) {
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s := &Smart{
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Path: "smartctl",
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Attributes: false,
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}
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// overwriting exec commands with mock commands
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execCommand = fakeExecCommand
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var acc testutil.Accumulator
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err := s.Gather(&acc)
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require.NoError(t, err)
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assert.Equal(t, 5, acc.NFields(), "Wrong number of fields gathered")
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acc.AssertDoesNotContainMeasurement(t, "smart_attribute")
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// tags = map[string]string{}
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var testsAda0Device = []struct {
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fields map[string]interface{}
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tags map[string]string
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}{
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{
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map[string]interface{}{
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"exit_status": int(0),
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"health_ok": bool(true),
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"read_error_rate": int64(0),
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"temp_c": int64(34),
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"udma_crc_errors": int64(0),
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},
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map[string]string{
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"device": "/dev/ada0",
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"model": "APPLE SSD SM256E",
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"serial_no": "S0X5NZBC422720",
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"wwn": "5002538043584d30",
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"enabled": "Enabled",
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"capacity": "251000193024",
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},
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},
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}
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for _, test := range testsAda0Device {
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acc.AssertContainsTaggedFields(t, "smart_device", test.fields, test.tags)
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}
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}
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func TestExcludedDev(t *testing.T) {
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assert.Equal(t, true, excludedDev([]string{"/dev/pass6"}, "/dev/pass6 -d atacam"), "Should be excluded.")
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assert.Equal(t, false, excludedDev([]string{}, "/dev/pass6 -d atacam"), "Shouldn't be excluded.")
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assert.Equal(t, false, excludedDev([]string{"/dev/pass6"}, "/dev/pass1 -d atacam"), "Shouldn't be excluded.")
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}
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// fackeExecCommand is a helper function that mock
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// the exec.Command call (and call the test binary)
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func fakeExecCommand(command string, args ...string) *exec.Cmd {
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cs := []string{"-test.run=TestHelperProcess", "--", command}
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cs = append(cs, args...)
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cmd := exec.Command(os.Args[0], cs...)
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cmd.Env = []string{"GO_WANT_HELPER_PROCESS=1"}
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return cmd
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}
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// TestHelperProcess isn't a real test. It's used to mock exec.Command
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// For example, if you run:
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// GO_WANT_HELPER_PROCESS=1 go test -test.run=TestHelperProcess -- --scan
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// it returns below mockScanData.
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func TestHelperProcess(t *testing.T) {
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if os.Getenv("GO_WANT_HELPER_PROCESS") != "1" {
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return
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}
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args := os.Args
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// Previous arguments are tests stuff, that looks like :
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// /tmp/go-build970079519/…/_test/integration.test -test.run=TestHelperProcess --
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cmd, arg1, args := args[3], args[4], args[5:]
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if cmd == "smartctl" {
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if arg1 == "--scan" {
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fmt.Fprint(os.Stdout, mockScanData)
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}
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if arg1 == "--info" {
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fmt.Fprint(os.Stdout, mockInfoAttributeData)
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}
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} else {
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fmt.Fprint(os.Stdout, "command not found")
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os.Exit(1)
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}
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os.Exit(0)
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}
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Block a user